Jean M. Schultz is the Founder, President and CEO of E&M Technologies, Inc. and Wraidd, LLC. Ms. Schultz is a expert in biometric technologies and is recognized across the government for innovative and strategic biometric expertise. Ms. Schultz has over 25 years of experience in architecture, systems integration, software programming, program management and expertise in Public Key Infrastructure, biometrics, smart cards and information security. Ms. Schultz has specialized in the development of information exchange - providing interagency enterprise-wide implementation for counter-terrorism biometrics – and works with these communities on special identity management and biometrics initiatives. Ms. Schultz has been integral in the development of standards for smart cards, cryptography, biometrics modalities and the fusion of biometric modalities with the National Institute of Technologies and Standards. She has been involved in the full life cycle of identity management systems specific to biometrics, PKI, smart cards and physical security systems to include architecture, R&D, T&E and implementation for the warfighter.
Additionally, Ms. Schultz has been influential in a variety of interagency activities such as interoperability of enterprise systems (US VISIT IDENT, FBI IAFIS, DoD ABIS), and facilitated open architectures and the enhancement of interagency information sharing. Ms Schultz holds a BA in Electrical Engineering, a Masters in Information Security and is currently pursing a Doctorate in Cybersecurity. Ms. Schultz has been published in Government Computer News, Federal Computer Weekly and other Army publications.